text.skipToContent text.skipToNavigation
background-image

LTE-Advanced Relay Technology and Standardization von Yuan, Yifei (eBook)

  • Erscheinungsdatum: 25.07.2012
  • Verlag: Springer-Verlag
eBook (PDF)
118,99 €
inkl. gesetzl. MwSt.
Sofort per Download lieferbar

Online verfügbar

LTE-Advanced Relay Technology and Standardization

LTE-Advanced relay technology and standardization provides a timely reference work for relay technology with the finalizing of LTE Release 10 specifications. LTE-Advanced is quickly becoming the global standard for 4G cellular communications. The relay technology, as one of the key features in LTE-Advanced, helps not only to improve the system coverage and capacity, but also to save the costs of laying wireline backhaul. As a leading researcher in the field of LTE-Advanced standards, the author provides an in-depth description of LTE-A relay technology, and explains in detail the standard specification and design principles. Readers from both academic and industrial fields can find sections of interest to them: Sections 2 & 4 could benefit researchers in academia and those who are engaged in exploratory work, while Sections 3 & 4 are more useful to engineers. Dr. Yifei Yuan is the Technical Director at the Standards Department of ZTE Inc. Dr. Yifei Yuan, Technical Director at the Standards Department of ZTE Inc., has been responsible for the overall technical direction of LTE-Advanced standards research since 2008. Before this he worked on key technologies of 3G and 4G wireless communications at Bell Labs for eight years. He received his Bachelor and Master degrees from Tsinghua University, Beijing, and completed his Ph.D in Electrical & Computer Engineering at Carnegie Mellon University, USA. He was included in the 'One Thousand Talents Plan/Recruitment Program of Global Experts' by the Chinese government in 2010.

Produktinformationen

    Format: PDF
    Kopierschutz: AdobeDRM
    Seitenzahl: 186
    Erscheinungsdatum: 25.07.2012
    Sprache: Englisch
    ISBN: 9783642296765
    Verlag: Springer-Verlag
    Größe: 6990kBytes
Weiterlesen weniger lesen

Kundenbewertungen