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Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis von Magonov, Sergei N. (eBook)

  • Erscheinungsdatum: 26.09.2008
  • Verlag: Wiley-VCH
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Surface Analysis with STM and AFM

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations.
Practical examples are taken from:

inorganic layered materials
organic conductors
organic adsorbates at liquid-solid interfaces
self-assembled amphiphiles
polymers
This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

Produktinformationen

    Format: PDF
    Kopierschutz: AdobeDRM
    Seitenzahl: 335
    Erscheinungsdatum: 26.09.2008
    Sprache: Englisch
    ISBN: 9783527615100
    Verlag: Wiley-VCH
    Größe: 20202 kBytes
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